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GLAST/LAT > DAQ and FSW > FSW > Doxygen Index > SIB / V1-3-0

Constituent: sib_eeprom_test     Tag: rad750

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sib_eeprom_test.c File Reference

Function definitions for SIB EEPROM hardware test. More...

#include "vxWorks.h"
#include "stdio.h"
#include "tffs/tffsDrv.h"
#include "SIB/sib_eeprom_test.h"

Include dependency graph for sib_eeprom_test.c:

Defines
#define	WDOG_RESET
#define	EEPROM_WORD_SIZE   4
#define	EEPROM_CHIP_SIZE   (0x20000 * EEPROM_WORD_SIZE)
Functions
int	sib_eeprom_test_data (int drv, unsigned int offset, unsigned int dataWrite, int print)
int	sib_eeprom_test (int drv, int chip)

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Detailed Description

Function definitions for SIB EEPROM hardware test.

Author:

D.L. Wood

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Define Documentation

#define EEPROM_CHIP_SIZE   (0x20000 * EEPROM_WORD_SIZE)

The size in bytes of one EEPROM chip.

#define EEPROM_WORD_SIZE   4

The size of an addressable EEPROM location.

#define WDOG_RESET

Resets the watchdog timer on the RAD750; a no-op for other targets.

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Function Documentation

int sib_eeprom_test (  int  drv, int  chip )

Tests the SIB EEPROM banks by writing mulitple test patterns to each location and verifying the data through read back. Parameters: drv  The bank indicator (0 = lower, 1 = upper) chip  The chip row number to test. Return values: 0  Success. -1  Failure.

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int sib_eeprom_test_data (  int  drv, unsigned int  offset, unsigned int  dataWrite, int  print )  [static]

Tests a single EEPROM location by writing data to each location and verifying the operation through tffsRawio() status and data read back. Parameters: drv  The bank indicator (0 = lower, 1 = upper) offset  The location offset into the bank. dataWrite  The data value to test. print  Flag for output (0 = no print on success, 1 = print on success). Return values: 0  Success. -1  Failure.

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