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Constituent: mem_unit_test     Tag: rad750

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mem_test_dump.h File Reference

Interface to the test functions found in mem_test_dump.c. More...

#include "mem_unit_test.h"

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Functions

void mem_DumpParam_test (test_Test_Descriptor *td_p, const unsigned int bit_mask)
 Test for Memory Dump bad parameter handling.

void mem_DumpContext_test (test_Test_Descriptor *td_p, const unsigned int bit_mask)
 Unit test for Memory Dump context operations.

void mem_DumpMemory_test (test_Test_Descriptor *td_p, const unsigned int bit_mask)
 Unit test for nominal dump.

void mem_DumpWrap_test (test_Test_Descriptor *td_p, const unsigned int bit_mask)
 Unit test for wrapped dump.

void mem_DumpRegSet_test (test_Test_Descriptor *td_p, const unsigned int bit_mask)
 Unit test for register set dump.

void mem_DumpPCI_test (test_Test_Descriptor *td_p, const unsigned int bit_mask)
 Unit test for PCI configuration dump.

Detailed Description

Interface to the test functions found in mem_test_dump.c. 

  CVS $Id: mem_test_dump.h,v 1.3 2004/06/29 14:13:29 dmay Exp $

Interface to the memory dump test functions.

Function Documentation

void mem_DumpContext_test (  test_Test_Descriptor *  td_p,
const unsigned int  bit_mask
) 
 

Unit test for Memory Dump context operations.

Verify the handling of Memory Dump context 'get', 'release', and 'describe' operations.

Parameters:
td_p Pointer to test descriptor.
bit_mask Bitmask ID for this subtest.
Return values:
0 Success.
-1 Failure.

void mem_DumpMemory_test (  test_Test_Descriptor *  td_p,
const unsigned int  bit_mask
) 
 

Unit test for nominal dump.

Run unit test for memory dumps. Test the nominal memory dump operations, no extensive error handling done in this test.

This test runs two simultaneous dumps (to test re-entrant interfaces). A static memory buffer is targeted for the dump. This data is dumped to the "dest" member of the mem_DumpUnitTestData structre used to control the dump. Two dumps are run (firstDump and secondDump). The target memory of these dumps overlap.

The following features are tested:

  • Dump state machine, including the proper setup of a dump by MEM_StartDump() and return arguments of MEM_GetDumpData().
  • Proper operation of MEM_GetDumpData(), i.e. the proper data is returned for the dump.
  • Re-entrancy of dump code.

The following features are assumed to work:

  • MEM_GetDumpContext()
  • MEM_ReleaseDumpContext()

WARNING!!! This test assumes that the memory map is valid. Memory maps are constructed for the RAD750 at this time. However, as luck has it, these tests can execute on the sun/gcc envrionment.

Parameters:
td_p Pointer to test descriptor.
bit_mask Bitmask ID for this subtest.
Returns:
Nothing.

void mem_DumpParam_test (  test_Test_Descriptor *  td_p,
const unsigned int  bit_mask
) 
 

Test for Memory Dump bad parameter handling.

Verify the handling of bad parameters by the Memory Dump functions.

Parameters:
td_p Pointer to test descriptor.
bit_mask Bitmask ID for this subtest.
Return values:
0 Success.
-1 Failure.

void mem_DumpPCI_test (  test_Test_Descriptor *  td_p,
const unsigned int  bit_mask
) 
 

Unit test for PCI configuration dump.

Run unit test for PCI configuration memory dumps. Test the nominal dump operations, no extensive error handling done in this test.

The following features are tested:

  • Dump state machine, including the proper setup of a dump by MEM_StartDump() and return arguments of MEM_GetDumpData().
  • Proper operation of MEM_GetDumpData(), i.e. the proper data is returned for the dump.

The following features are assumed to work:

  • MEM_GetDumpContext()
  • MEM_ReleaseDumpContext()

Parameters:
td_p Pointer to test descriptor.
bit_mask Bitmask ID for this subtest.
Return values:
0 Success.
-1 Failure.

void mem_DumpRegSet_test (  test_Test_Descriptor *  td_p,
const unsigned int  bit_mask
) 
 

Unit test for register set dump.

Run unit test for register set memory dumps. Test the nominal memory dump operations, no extensive error handling done in this test.

The following features are tested:

  • Dump state machine, including the proper setup of a dump by MEM_StartDump() and return arguments of MEM_GetDumpData().
  • Proper operation of MEM_GetDumpData(), i.e. the proper data is returned for the dump.
  • Simulated register set memory map.

The following features are assumed to work:

  • MEM_GetDumpContext()
  • MEM_ReleaseDumpContext()

Parameters:
td_p Pointer to test descriptor.
bit_mask Bitmask ID for this subtest.
Return values:
0 Success.
-1 Failure.

int mem_DumpWrap_test (  test_Test_Descriptor *  td_p,
const unsigned int  bit_mask
) 
 

Unit test for wrapped dump.

Run unit test for wrapped memory dumps. Test the nominal memory dump operations, no extensive error handling done in this test.

This test runs a dump to completion 4 times.

The following features are tested:

  • Dump state machine, including the proper setup of a dump by MEM_StartDump() and return arguments of MEM_GetDumpData().
  • Proper operation of MEM_GetDumpData(), i.e. the proper data is returned for the dump.
  • Wrapped dumps.

The following features are assumed to work:

  • MEM_GetDumpContext()
  • MEM_ReleaseDumpContext()

WARNING!!! This test assumes that the memory map is valid. Memory maps are constructed for the RAD750 at this time. However, as luck has it, these tests can execute on the sun/gcc envrionment.

Parameters:
td_p Pointer to test descriptor.
bit_mask Bitmask ID for this subtest.
Return values:
0 Success.
-1 Failure.
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