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Constituent: mem_unit_test     Tag: rad750


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mem_test_load.h File Reference

Interface to the test functions found in mem_test_load.c. More...

#include "mem_unit_test.h"

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Functions

void mem_LoadParam_test (test_Test_Descriptor *td_p, const unsigned int bit_mask)
 Test for Memory Load bad parameter handling.

void mem_LoadContext_test (test_Test_Descriptor *td_p, const unsigned int bit_mask)
 Unit test for Memory Load context operations.

void mem_LoadSize_test (test_Test_Descriptor *td_p, const unsigned int bit_mask)
 Unit test for Memory Write telecommands.

void mem_LoadMemory_test (test_Test_Descriptor *td_p, const unsigned int bit_mask)
 Unit test for Memory Write telecommands.


Detailed Description

Interface to the test functions found in mem_test_load.c.

  CVS $Id: mem_test_load.h,v 1.2 2004/06/29 14:16:29 dmay Exp $
  

Interface to the memory load test functions.


Function Documentation

void mem_LoadContext_test test_Test_Descriptor td_p,
const unsigned int  bit_mask
 

Unit test for Memory Load context operations.

Verify the handling of Memory Load context 'get', 'release', and 'info' operations.

Parameters:
td_p Pointer to test descriptor.
bit_mask Bitmask ID for this subtest.
Return values:
0 Success.
-1 Failure.

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void mem_LoadMemory_test test_Test_Descriptor td_p,
const unsigned int  bit_mask
 

Unit test for Memory Write telecommands.

Verify the handling of Memory Write telecommands.

Parameters:
td_p Pointer to test descriptor.
bit_mask Bitmask ID for this subtest.
Return values:
0 Success.
-1 Failure.

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void mem_LoadParam_test test_Test_Descriptor td_p,
const unsigned int  bit_mask
 

Test for Memory Load bad parameter handling.

Verify the handling of bad parameters by the Memory Load functions.

Parameters:
td_p Pointer to test descriptor.
bit_mask Bitmask ID for this subtest.
Return values:
0 Success.
-1 Failure.

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void mem_LoadSize_test test_Test_Descriptor td_p,
const unsigned int  bit_mask
 

Unit test for Memory Write telecommands.

Verify the handling of Memory Write telecommands with various amounts of data.

Parameters:
td_p Pointer to test descriptor.
bit_mask Bitmask ID for this subtest.
Return values:
0 Success.
-1 Failure.

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